Mapping Nanotechnology Innovations and Knowledge will define the application of Information Technology’s systematic and automated knowledge mapping methodology to collect, analyze and report nanotechnology research on a global basis. The result of these analyses will be a systematic presentation of the state of the art of nanotechnology, which will include basic analysis, content analysis, and citation network analysis of comprehensive nanotechnology findings across technology domains, inventors, institutions, and countries. Many sources will be explored in detail to ensure the examination will be global in nature, comprehensive in scope, reliable in content, and completely current. Among the sources investigated and catalogued will be the nanotechnology patent and literature databases from the US patent Office (USPTO), the European Patent Office (EPO), and the Japanese Patent Office (JPO).

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