Microstructural Characterization of Materials– 2nd Edition David Brandon and Wayne D. Kaplan. Israel Institute of Technology, Haifa, Israel Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X–ray radiation, a high–energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X–ray diffraction, electron microscopy, and scanning probe microscopy. The book is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition of Microstructural Characterization of Materials explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal...

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